1. [Publications](/publications) 2. SEC-BADAEC: An Efficient ECC With No Vacancy for Strong Memory Protection # SEC-BADAEC: An Efficient ECC With No Vacancy for Strong Memory Protection ![](/sites/default/files/styles/wide/public/publications/sec_badec_img.JPG?itok=mvAHJmHH) Shrinking process technology and rising memory densities have made memories increasingly vulnerable to errors. Accordingly, DRAM vendors have introduced On-die Error Correction Code (O-ECC) to protect data against the growing number of errors. Current O-ECC provides weak Single Error Correction (SEC), but future memories will require stronger protection as error rates rise. This paper proposes a novel ECC, called Single Error Correction--Byte-Aligned Double Adjacent Error Correction (SEC-BADAEC), and its construction algorithm to improve memory reliability. SEC-BADAEC requires the same redundancy as SEC O-ECC, but it can also correct some frequent 2-bit error patterns. Our evaluation shows SEC-BADAEC can improve memory reliability by 23.5% and system-level reliability by 29.8% with negligible overheads. ## Authors Yuseok Song (Sungkyunkwan University ) Sangjae Park (Sungkyunkwan University ) [Michael B. Sullivan](/person/mike-sullivan) Jungrae Kim (Sungkyunkwan University ) ## Publication Date Thursday, August 25, 2022 ## Published in [IEEE Access](https://ieeexplore.ieee.org/abstract/document/9866743) ## Research Area [Computer Architecture](/research-area/computer-architecture) [Resilience and Safety](/research-area/resilience) ## External Links [IEEE Digital Library](https://ieeexplore.ieee.org/abstract/document/9866743) ## Copyright This material is posted here with permission of the IEEE. Internal or personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution must be obtained from the IEEE by writing to .