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TTA-COPE: Test-Time Adaptation for Category-Level Object Pose Estimation
Taeyeop Lee
,
Jonathan Tremblay
,
Valts Blukis
,
Bowen Wen
,
Byeong-Uk Lee
,
Inkyu Shin
,
Stan Birchfield
,
In So Kweon
,
Kuk-Jin Yoon
June 2023
Cite
arXiv
Type
Conference paper
Publication
IEEE Conference on Computer Vision and Pattern Recognition (CVPR)
Jonathan Tremblay
Valts Blukis
Bowen Wen
Stan Birchfield
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