Hamartia: A Fast and Accurate Error Injection Framework

Single bit-flip has been the most popular error model for resilience studies with fault injection. We use RTL gate-level fault injection to show that this model fails to cover many realistic hardware faults. Specifically, single-event transients from combinational logic and single-event upsets in pipeline latches can lead to complex multi-bit errors at the architecture level. However, although accurate, RTL simulation is too slow to evaluate application-level resilience. To strike a balance between model accuracy and injection speed, we refine the concept of hierarchical injection to prune faults with known outcomes, saving 62% of program runs at 2% margin of error on average across 9 benchmark programs. Our implementation of the hierarchical error injector is not only accurate but also fast because it is able to source realistic error patterns using on demand RTL gate-level fault injection. Our tool outperforms state-of-the-art assembly-level and compiler-based error injectors by up to 6X, while providing higher fidelity.

Chun-Kai Chang (The University of Texas at Austin)
Sangkug Lym (The University of Texas at Austin)
Nicholas Kelly (The University of Texas at Austin)
Mattan Erez (The University of Texas at Austin)
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